Rigaku Smartlab X-ray diffractometer:9 kW X-ray tube with rotation Cu anode optics: parallel beam/convergent beam/Bragg-Brentano Ge (220)x2 monochromator and analyzer, Johansson-type Ge monochromator detectors: scintillation SC-70, D/teX Ultra 250 (D1) sample stage: Eulerian cradle, X-Y stage, stage for powder samples, stage for capillary samples, 6 position sample changer with spinner, Anton Paar HTK 1200N HT Chamber.grazing incidence diffraction and texture analysis (pole figures). Our diffractometers also enables us to make different thin film analyses e.g. The figure below shows the changes in the diffraction pattern of a battery material inside a working battery cell. In addition to acquiring conventional ex situ XRPD patterns, we can also perform in situ / operando experiments in order to follow structural and microstructural changes in the materials over time during the exposure to external stimuli. The diffraction pattern may be used for phase identification, ab initio structure solution, structural refinement, quantitative phase analysis, and determination of microstrain and crystallite sizes. The intensities of the diffraction cones are normally recorded radially as a function of 2θ, forming a one-dimensional diffraction pattern. When an X-ray beam impinges a powdered sample it will be diffracted by the lattice planes present in the sample and form a set of diffraction cones. All our diffractometers use X-ray tubes with copper anodes to generate X-rays. At DTU Energy, we have both diffractometers dedicated to X-ray powder diffraction (XRPD) and multi-purpose diffractometers that can be used to study both thin films and powdered samples. X-ray diffraction (XRD) is a non-destructive technique used for characterization of atomic and molecular structures in crystalline materials.
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